Using optical anisotropy as a quality factor to rapidly characterize structural qualities of large-area graphene films.
Identifieur interne : 000288 ( Main/Exploration ); précédent : 000287; suivant : 000289Using optical anisotropy as a quality factor to rapidly characterize structural qualities of large-area graphene films.
Auteurs : RBID : pubmed:23323974Abstract
In this study, we find that the optical anisotropy of graphene films could be used as an alternative quality factor for the rapid characterization of large-area graphene films prepared through chemical vapor deposition. We develop an angle-variable spectroscopic method to rapidly determine the optical anisotropy of graphene films. Unlike approaches using Raman scattering spectroscopy, this optical anisotropy method allows ready characterization of the structural quality of large-area graphene samples without the application of high-intensity laser irradiation or complicated optical setups. Measurements of optical anisotropy also allow us to distinguish graphene samples with different extents of structural imperfections; the results are consistent with those obtained from using Raman scattering spectroscopy. In addition, we also study the properties of graphene-based transparent conductive films at wide incident angles because of the advantage of the optical anisotropic properties of graphene. The transmittance of graphene is much higher than that of indium tin oxide films, especially at large incident angles.
DOI: 10.1021/ac302863w
PubMed: 23323974
Links toward previous steps (curation, corpus...)
Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en">Using optical anisotropy as a quality factor to rapidly characterize structural qualities of large-area graphene films.</title><author><name sortKey="Liu, Yu Lun" uniqKey="Liu Y">Yu-Lun Liu</name><affiliation wicri:level="1"><nlm:affiliation>Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.</nlm:affiliation><country xml:lang="fr">République de Chine (Taïwan)</country><wicri:regionArea>Department of Materials Science and Engineering, National Taiwan University, Taipei</wicri:regionArea></affiliation></author><author><name sortKey="Yu, Chen Chieh" uniqKey="Yu C">Chen-Chieh Yu</name></author><author><name sortKey="Fang, Cheng Yi" uniqKey="Fang C">Cheng-Yi Fang</name></author><author><name sortKey="Chen, Hsuen Li" uniqKey="Chen H">Hsuen-Li Chen</name></author><author><name sortKey="Chen, Chun Wei" uniqKey="Chen C">Chun-Wei Chen</name></author><author><name sortKey="Kuo, Chun Chiang" uniqKey="Kuo C">Chun-Chiang Kuo</name></author><author><name sortKey="Chang, Cheng Kai" uniqKey="Chang C">Cheng-Kai Chang</name></author><author><name sortKey="Chen, Li Chyong" uniqKey="Chen L">Li-Chyong Chen</name></author><author><name sortKey="Chen, Kuei Hsien" uniqKey="Chen K">Kuei-Hsien Chen</name></author></titleStmt><publicationStmt><date when="2013">2013</date><idno type="doi">10.1021/ac302863w</idno><idno type="RBID">pubmed:23323974</idno><idno type="pmid">23323974</idno><idno type="wicri:Area/Main/Corpus">000850</idno><idno type="wicri:Area/Main/Curation">000850</idno><idno type="wicri:Area/Main/Exploration">000288</idno></publicationStmt></fileDesc><profileDesc><textClass></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">In this study, we find that the optical anisotropy of graphene films could be used as an alternative quality factor for the rapid characterization of large-area graphene films prepared through chemical vapor deposition. We develop an angle-variable spectroscopic method to rapidly determine the optical anisotropy of graphene films. Unlike approaches using Raman scattering spectroscopy, this optical anisotropy method allows ready characterization of the structural quality of large-area graphene samples without the application of high-intensity laser irradiation or complicated optical setups. Measurements of optical anisotropy also allow us to distinguish graphene samples with different extents of structural imperfections; the results are consistent with those obtained from using Raman scattering spectroscopy. In addition, we also study the properties of graphene-based transparent conductive films at wide incident angles because of the advantage of the optical anisotropic properties of graphene. The transmittance of graphene is much higher than that of indium tin oxide films, especially at large incident angles.</div></front></TEI><pubmed><MedlineCitation Owner="NLM" Status="PubMed-not-MEDLINE"><PMID Version="1">23323974</PMID><DateCreated><Year>2013</Year><Month>02</Month><Day>05</Day></DateCreated><DateCompleted><Year>2014</Year><Month>04</Month><Day>22</Day></DateCompleted><Article PubModel="Print-Electronic"><Journal><ISSN IssnType="Electronic">1520-6882</ISSN><JournalIssue CitedMedium="Internet"><Volume>85</Volume><Issue>3</Issue><PubDate><Year>2013</Year><Month>Feb</Month><Day>5</Day></PubDate></JournalIssue><Title>Analytical chemistry</Title><ISOAbbreviation>Anal. Chem.</ISOAbbreviation></Journal><ArticleTitle>Using optical anisotropy as a quality factor to rapidly characterize structural qualities of large-area graphene films.</ArticleTitle><Pagination><MedlinePgn>1605-14</MedlinePgn></Pagination><ELocationID EIdType="doi" ValidYN="Y">10.1021/ac302863w</ELocationID><Abstract><AbstractText>In this study, we find that the optical anisotropy of graphene films could be used as an alternative quality factor for the rapid characterization of large-area graphene films prepared through chemical vapor deposition. We develop an angle-variable spectroscopic method to rapidly determine the optical anisotropy of graphene films. Unlike approaches using Raman scattering spectroscopy, this optical anisotropy method allows ready characterization of the structural quality of large-area graphene samples without the application of high-intensity laser irradiation or complicated optical setups. Measurements of optical anisotropy also allow us to distinguish graphene samples with different extents of structural imperfections; the results are consistent with those obtained from using Raman scattering spectroscopy. In addition, we also study the properties of graphene-based transparent conductive films at wide incident angles because of the advantage of the optical anisotropic properties of graphene. The transmittance of graphene is much higher than that of indium tin oxide films, especially at large incident angles.</AbstractText></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Liu</LastName><ForeName>Yu-Lun</ForeName><Initials>YL</Initials><Affiliation>Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.</Affiliation></Author><Author ValidYN="Y"><LastName>Yu</LastName><ForeName>Chen-Chieh</ForeName><Initials>CC</Initials></Author><Author ValidYN="Y"><LastName>Fang</LastName><ForeName>Cheng-Yi</ForeName><Initials>CY</Initials></Author><Author ValidYN="Y"><LastName>Chen</LastName><ForeName>Hsuen-Li</ForeName><Initials>HL</Initials></Author><Author ValidYN="Y"><LastName>Chen</LastName><ForeName>Chun-Wei</ForeName><Initials>CW</Initials></Author><Author ValidYN="Y"><LastName>Kuo</LastName><ForeName>Chun-Chiang</ForeName><Initials>CC</Initials></Author><Author ValidYN="Y"><LastName>Chang</LastName><ForeName>Cheng-Kai</ForeName><Initials>CK</Initials></Author><Author ValidYN="Y"><LastName>Chen</LastName><ForeName>Li-Chyong</ForeName><Initials>LC</Initials></Author><Author ValidYN="Y"><LastName>Chen</LastName><ForeName>Kuei-Hsien</ForeName><Initials>KH</Initials></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType>Journal Article</PublicationType></PublicationTypeList><ArticleDate DateType="Electronic"><Year>2013</Year><Month>01</Month><Day>16</Day></ArticleDate></Article><MedlineJournalInfo><Country>United States</Country><MedlineTA>Anal Chem</MedlineTA><NlmUniqueID>0370536</NlmUniqueID><ISSNLinking>0003-2700</ISSNLinking></MedlineJournalInfo></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="aheadofprint"><Year>2013</Year><Month>1</Month><Day>16</Day></PubMedPubDate><PubMedPubDate PubStatus="entrez"><Year>2013</Year><Month>1</Month><Day>18</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="pubmed"><Year>2013</Year><Month>1</Month><Day>18</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>2013</Year><Month>1</Month><Day>18</Day><Hour>6</Hour><Minute>1</Minute></PubMedPubDate></History><PublicationStatus>ppublish</PublicationStatus><ArticleIdList><ArticleId IdType="doi">10.1021/ac302863w</ArticleId><ArticleId IdType="pubmed">23323974</ArticleId></ArticleIdList></PubmedData></pubmed></record>Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=IndiumV2/Data/Main/Exploration
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 000288 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd -nk 000288 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien
|wiki= *** parameter Area/wikiCode missing ***
|area= IndiumV2
|flux= Main
|étape= Exploration
|type= RBID
|clé= pubmed:23323974
|texte= Using optical anisotropy as a quality factor to rapidly characterize structural qualities of large-area graphene films.
}}
Pour générer des pages wiki
HfdIndexSelect -h $EXPLOR_AREA/Data/Main/Exploration/RBID.i -Sk "pubmed:23323974" \
| HfdSelect -Kh $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd \
| NlmPubMed2Wicri -a IndiumV2
| This area was generated with Dilib version V0.5.76. |  |